On-chip Pseudorandom Testing for Linear and Nonlinear MEMS
نویسندگان
چکیده
In this paper we study the use of pseudorandom test techniques for linear and nonlinear devices, in particular Micro Electro Mechanical Systems (MEMS). These test techniques lead to practical BuiltIn-Self-Test techniques (BIST). We will first present the pseudorandom test technique for Linear Time Invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.
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